Applus+ Laboratories will participate in the Conference Fault Diagnosis and Tolerance in cryptography (FDTC) that will take place on the 24th of August in Atlanta, United States. During the Conference, Applus+ experts will present a new attack technique against secure integrated circuits (secure IC), the Lateral Laser Fault Injection (LLFI).
Applus+ Laboratories collaborates with the main forums and working groups of the security sector. The objective of these forums is to analyze the security of the chips and develop new evaluation techniques that integrate the last technology generation. This work helps the industry to develop new countermeasures against the latest cybersecurity attack techniques and finally improve the end user security.